神戸大学附属図書館デジタルアーカイブ
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https://hdl.handle.net/20.500.14094/90007435
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2024-04-23
20:29 集計
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90007435 (fulltext)
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2.04 MB
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ファイル出力
メタデータID
90007435
アクセス権
open access
出版タイプ
Accepted Manuscript
タイトル
Crystal Orientation Imaging of Organic Monolayer Islands by Polarized Light Microscopy
著者
著者ID
A2258
研究者ID
1000090736654
KUID
https://kuid-rm-web.ofc.kobe-u.ac.jp/search/detail?systemId=b9487d8e029552e4520e17560c007669
著者名
Hattori, Yoshiaki
服部, 吉晃
ハットリ, ヨシアキ
所属機関名
工学研究科
著者ID
A0125
研究者ID
1000010345142
KUID
https://kuid-rm-web.ofc.kobe-u.ac.jp/search/detail?systemId=323dcdd3ee9beeca520e17560c007669
著者名
Kitamura, Masatoshi
北村, 雅季
キタムラ, マサトシ
所属機関名
工学研究科
収録物名
ACS Applied Materials & Interfaces
巻(号)
12(32)
ページ
36428-36436
出版者
American Chemical Society
刊行日
2020-08-12
公開日
2021-08-01
注記
Published online 21 July 2020
抄録
The initial stage of organic semiconductor film formation greatly affects the properties of films, which are used in organic devices including thin-film transistors and light-emitting diodes. Organic monolayer islands that are formed on a suitable substrate can be observed with a conventional optical microscope. Furthermore, the use of a polarized microscope allows the determination of the refractive index and crystal orientation of islands. Here, we report organic monolayer islands of 2,9-diphenyl-dinaphtho[2,3-b:2',3'-f]thieno[3,2-b]thiophene (DPh-DNTT) deposited on a Si substrate with thermally grown SiO2 to investigate the crystal orientation of islands by polarized light microscopy. The observation of DPh-DNTT islands under polarized quasi-monochromatic light reveals that reflection intensity depends on both the crystal orientation and irradiation wavelength. A comparison between experimental and calculated reflection intensities provides an estimate of an anisotropic complex refractive index in the plane. The crossed-polarized microscopy image of a SiO2/Si substrate with DPh-DNTT islands shows that the contrast between the islands and SiO2 surface is sensitive to the angle between the polarizer and analyzer and depends on the direction of crystal orientation. The dependence of reflection contrast, which can be explained by the anisotropic extinction coefficient, is used to confirm crystal orientation.
キーワード
DPh-DNTT
2D island
crystal orientation
polarized light microcopy
anisotropic refractive index
カテゴリ
工学研究科
学術雑誌論文
権利
This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Applied Materials & Interfaces, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acsami.0c08672
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資源タイプ
journal article
言語
English (英語)
ISSN
1944-8244
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eISSN
1944-8252
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NCID
AA12406529
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関連情報
DOI
https://doi.org/10.1021/acsami.0c08672
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